STRUCTURED LIGHT PROJECTION THROUGH THE MINIMIZATION OF VISUAL ARTIFACTS BY WAY OF DELIBERATELY INTRODUCED OPTICAL ABERRATIONS

A triangulation device for measuring a measurement object by a projection of a structured light pattern onto the measurement object. The triangulation device includes a projector projecting the structured light pattern decomposable into different spatial frequencies onto the measurement object. The projector comprises a matrix of pixel elements and a lens system which determines a wavefront with a wavefront aberration from a reference wavefront, and a camera including a lens system and an imaging sensor, the camera being configured to receive the structured light pattern projected by the projector onto the measurement object, and a processing unit configured to provide distance information by evaluating imaging information provided by the camera. The wavefront aberration comprises a primary spherical aberration coefficient Z, wherein the primary spherical aberration coefficient Zis larger than 0.5λ, wherein λ is a wavelength of the projected structured light pattern.