THREE-DIMENSIONAL MEASUREMENT DEVICE

Provided is a three-dimensional measurement device, including an illumination system (I) and an imaging system (II). The illumination system includes, along an illumination light path, a light source (), a light beam shaping apparatus (), a pattern modulation apparatus (), and a projection lens (). The pattern modulation apparatus is configured to form a coded pattern. The light beam shaping apparatus is configured to shape light emitted by the light source into near-parallel light. The projection lens is configured to project the coded pattern onto a target object. The imaging system includes an imaging lens (), a first beam-splitting system (), and an image sensor group including N image sensors (). The first beam-splitting system is configured to transmit the coded pattern received by the imaging lens and projected onto the target object to the N image sensors of the image sensor group.