SYSTEM FOR PERFORMING A MEASUREMENT ON A COMPONENT

A system for performing a measurement on a component, the system comprising: an integrated circuit (IC) comprising: analog to digital (ADC) converter circuitry; and processing circuitry, wherein the system further comprises: difference circuitry, wherein: the difference circuitry is operable to generate a compensated measurement voltage by subtracting a compensation voltage received from a voltage source external to the integrated circuit from a measurement voltage output by the component in response to a stimulus signal received by the component; the ADC circuitry is configured to convert the compensated measurement voltage into a digital compensated measurement signal; and the measurement circuitry is configured to generate a measurement result based on the digital compensated measurement signal.