{
  "$type": "site.standard.document",
  "description": "A system for performing a measurement on a component, the system comprising: an integrated circuit (IC) comprising: analog to digital (ADC) converter circuitry; and processing circuitry, wherein the system further comprises: difference circuitry, wherein: the difference circuitry is operable to…",
  "path": "/patents/1366488",
  "publishedAt": "2024-07-11T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01R31/3648",
    "Cirrus Logic International Semiconductor Ltd."
  ],
  "textContent": "A system for performing a measurement on a component, the system comprising: an integrated circuit (IC) comprising: analog to digital (ADC) converter circuitry; and processing circuitry, wherein the system further comprises: difference circuitry, wherein: the difference circuitry is operable to generate a compensated measurement voltage by subtracting a compensation voltage received from a voltage source external to the integrated circuit from a measurement voltage output by the component in response to a stimulus signal received by the component; the ADC circuitry is configured to convert the compensated measurement voltage into a digital compensated measurement signal; and the measurement circuitry is configured to generate a measurement result based on the digital compensated measurement signal.",
  "title": "SYSTEM FOR PERFORMING A MEASUREMENT ON A COMPONENT"
}