{
  "$type": "site.standard.document",
  "description": "Provided is a three-dimensional measurement device, including an illumination system (I) and an imaging system (II). The illumination system includes, along an illumination light path, a light source (), a light beam shaping apparatus (), a pattern modulation apparatus (), and a projection lens ()…",
  "path": "/patents/1297942",
  "publishedAt": "2021-08-19T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01B11/2509",
    "CHENGDU PIN TAI DING FENG BUSINESS ADMINISTRATION"
  ],
  "textContent": "Provided is a three-dimensional measurement device, including an illumination system (I) and an imaging system (II). The illumination system includes, along an illumination light path, a light source (), a light beam shaping apparatus (), a pattern modulation apparatus (), and a projection lens (). The pattern modulation apparatus is configured to form a coded pattern. The light beam shaping apparatus is configured to shape light emitted by the light source into near-parallel light. The projection lens is configured to project the coded pattern onto a target object. The imaging system includes an imaging lens (), a first beam-splitting system (), and an image sensor group including N image sensors (). The first beam-splitting system is configured to transmit the coded pattern received by the imaging lens and projected onto the target object to the N image sensors of the image sensor group.",
  "title": "THREE-DIMENSIONAL MEASUREMENT DEVICE"
}