DIAGNOSIS CIRCUIT OF PARALLEL-STRUCTURE MOSFETS INCLUDING MUX AND DIAGNOSIS METHOD USING THE SAME

The present invention relates to a circuit capable of individually diagnosing abnormality of a plurality of internal FETs constituting a MOSFET provided between a secondary battery pack and an electric vehicle having the secondary battery pack therein and a diagnosis method. Voltage at both ends of each of the internal MOSFETs is measured while individually turning ON/OFF the internal MOSFETs, and is compared with a diagnosis table in order to determine abnormality thereof.