X-RAY FLUORESCENCE (XRF) MAPPING FOR ANODE INSPECTION

Aspects of the disclosure include leveraging an X-ray fluorescence (XRF) mapping of copper current collectors for non-contact, non-destructive, in-line quality inspections of thin lithium metal anodes. An exemplary method can include receiving an electrode at a detection surface of the XRF detector. The electrode can include the lithium anode on a surface of a current collector. X-rays are passed through the lithium anode and into the current collector and the intensity of characteristic radiation returning from the current collector is measured at the XRF detector. A lithium anode characteristic can be inferred based on the measured intensity of characteristic radiation from the current collector.