{
  "$type": "site.standard.document",
  "description": "Aspects of the disclosure include leveraging an X-ray fluorescence (XRF) mapping of copper current collectors for non-contact, non-destructive, in-line quality inspections of thin lithium metal anodes. An exemplary method can include receiving an electrode at a detection surface of the XRF…",
  "path": "/patents/1344719",
  "publishedAt": "2023-06-01T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "H01M10/058",
    "GM GLOBAL TECHNOLOGY OPERATIONS LLC"
  ],
  "textContent": "Aspects of the disclosure include leveraging an X-ray fluorescence (XRF) mapping of copper current collectors for non-contact, non-destructive, in-line quality inspections of thin lithium metal anodes. An exemplary method can include receiving an electrode at a detection surface of the XRF detector. The electrode can include the lithium anode on a surface of a current collector. X-rays are passed through the lithium anode and into the current collector and the intensity of characteristic radiation returning from the current collector is measured at the XRF detector. A lithium anode characteristic can be inferred based on the measured intensity of characteristic radiation from the current collector.",
  "title": "X-RAY FLUORESCENCE (XRF) MAPPING FOR ANODE INSPECTION"
}