EXAMINATION METHOD AND MANUFACTURING METHOD FOR ASSEMBLED BATTERY

An examination method of the present invention is characterized by including a step of bringing conductor probes into contact with surfaces of an examination target to measure voltage or electric resistance at a plurality of points on the surfaces of the examination target, the examination target being a resin current collector, an electrode sheet having an active material layer laminated on the resin current collector, a separator-attached electrode sheet in which a separator is combined with the electrode sheet, or a unit cell including one set of a positive electrode resin current collector, a positive electrode active material layer, a separator, a negative electrode active material layer, and a negative electrode resin current collector, which are laminated in order, and a step of determining whether or not a point at which the voltage or the electric resistance is out of an allowable range is present in the examination target.