{
  "$type": "site.standard.document",
  "description": "An examination method of the present invention is characterized by including a step of bringing conductor probes into contact with surfaces of an examination target to measure voltage or electric resistance at a plurality of points on the surfaces of the examination target, the examination target…",
  "path": "/patents/1354317",
  "publishedAt": "2023-11-09T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01R31/378",
    "APB CORPORATION"
  ],
  "textContent": "An examination method of the present invention is characterized by including a step of bringing conductor probes into contact with surfaces of an examination target to measure voltage or electric resistance at a plurality of points on the surfaces of the examination target, the examination target being a resin current collector, an electrode sheet having an active material layer laminated on the resin current collector, a separator-attached electrode sheet in which a separator is combined with the electrode sheet, or a unit cell including one set of a positive electrode resin current collector, a positive electrode active material layer, a separator, a negative electrode active material layer, and a negative electrode resin current collector, which are laminated in order, and a step of determining whether or not a point at which the voltage or the electric resistance is out of an allowable range is present in the examination target.",
  "title": "EXAMINATION METHOD AND MANUFACTURING METHOD FOR ASSEMBLED BATTERY"
}