On-site compensation of measurement devices

A system includes one or more processors that are configured to compensate a measurement tool by performing a method. The method includes capturing a first data using the measurement tool. The method further includes capturing a second data using the measurement tool. The method further includes detecting a first natural feature in the first data. The method further includes computing a difference in positions of the first natural feature in the first data and the second data respectively. The method further includes computing a compensation parameter to adjust the measurement tool based on the difference computed.