{
  "$type": "site.standard.document",
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  "description": "A system includes one or more processors that are configured to compensate a measurement tool by performing a method. The method includes capturing a first data using the measurement tool. The method further includes capturing a second data using the measurement tool. The method further includes…",
  "path": "/patents/964800",
  "publishedAt": "2026-05-26T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01C25/00",
    "FARO Technologies, Inc."
  ],
  "textContent": "A system includes one or more processors that are configured to compensate a measurement tool by performing a method. The method includes capturing a first data using the measurement tool. The method further includes capturing a second data using the measurement tool. The method further includes detecting a first natural feature in the first data. The method further includes computing a difference in positions of the first natural feature in the first data and the second data respectively. The method further includes computing a compensation parameter to adjust the measurement tool based on the difference computed.",
  "title": "On-site compensation of measurement devices"
}