APPARATUS AND METHOD FOR INSPECTING A SECONDARY CELL

An inspection apparatus for inspecting at least one secondary cell includes a fixed support part; a movable part; and pressing parts that are installed between the support part and the movable part. The pressing parts are freely movable along the main axis, two adjacent pressing parts defining a space () for accommodating a secondary cell. Each pressing part that is in contact with the at least one secondary cell has a temperature sensor, the temperature sensor being intended to measure the temperature of the at least one secondary cell which is subjected to a pressure between the pressing parts. An inspection method for inspecting at least one secondary cell is related to the inspection apparatus.