{
  "$type": "site.standard.document",
  "description": "An inspection apparatus for inspecting at least one secondary cell includes a fixed support part; a movable part; and pressing parts that are installed between the support part and the movable part. The pressing parts are freely movable along the main axis, two adjacent pressing parts defining a…",
  "path": "/patents/1376549",
  "publishedAt": "2025-08-14T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "H01M10/486",
    "VERKOR"
  ],
  "textContent": "An inspection apparatus for inspecting at least one secondary cell includes a fixed support part; a movable part; and pressing parts that are installed between the support part and the movable part. The pressing parts are freely movable along the main axis, two adjacent pressing parts defining a space () for accommodating a secondary cell. Each pressing part that is in contact with the at least one secondary cell has a temperature sensor, the temperature sensor being intended to measure the temperature of the at least one secondary cell which is subjected to a pressure between the pressing parts. An inspection method for inspecting at least one secondary cell is related to the inspection apparatus.",
  "title": "APPARATUS AND METHOD FOR INSPECTING A SECONDARY CELL"
}