Control system and semiconductor device used therein

The present invention aims to provide a control system which is capable of building high-precision current detecting means in a single-chip LSI and can be realized at a lower cost, and a semiconductor device used in the control system. Drive circuits 20-1 to 20-4 are provided inside the same semiconductor chip 1. The drive circuits are equipped with: current detecting shunt resistors Rs1 to Rs4 each of which is provided in each of the drive circuits and detects a current flowing through a load, the current detecting shunt resistors being provided within a semiconductor chip 1 by the same process; a dummy resistor Rd provided within the semiconductor chip 1 by the same process as the current detecting shunt resistors; and a calibration reference Rref externally attached to the semiconductor chip 1 and connected to the dummy resistor Rd. A correcting means 10 corrects the values of currents that flow through the current detecting shunt resistors, using the dummy resistor Rd and the calibration reference Rref.