{
  "$type": "site.standard.document",
  "description": "The present invention aims to provide a control system which is capable of building high-precision current detecting means in a single-chip LSI and can be realized at a lower cost, and a semiconductor device used in the control system. Drive circuits 20-1 to 20-4 are provided inside the same…",
  "path": "/patents/1014913",
  "publishedAt": "2011-03-16T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G05F1/46",
    "HITACHI AUTOMOTIVE SYSTEMS LTD [JP]"
  ],
  "textContent": "The present invention aims to provide a control system which is capable of building high-precision current detecting means in a single-chip LSI and can be realized at a lower cost, and a semiconductor device used in the control system. Drive circuits 20-1 to 20-4 are provided inside the same semiconductor chip 1. The drive circuits are equipped with: current detecting shunt resistors Rs1 to Rs4 each of which is provided in each of the drive circuits and detects a current flowing through a load, the current detecting shunt resistors being provided within a semiconductor chip 1 by the same process; a dummy resistor Rd provided within the semiconductor chip 1 by the same process as the current detecting shunt resistors; and a calibration reference Rref externally attached to the semiconductor chip 1 and connected to the dummy resistor Rd. A correcting means 10 corrects the values of currents that flow through the current detecting shunt resistors, using the dummy resistor Rd and the calibration reference Rref.",
  "title": "Control system and semiconductor device used therein"
}