{
  "$type": "site.standard.document",
  "bskyPostRef": {
    "cid": "bafyreiceqknxe7kfhrx2pn7j34pgbcvbbgj5hdcujidwsktuu26rqwctcu",
    "uri": "at://did:plc:ymwilo4vyyajhi6mnl4p7m4w/app.bsky.feed.post/3mjeyuej6eoh2"
  },
  "coverImage": {
    "$type": "blob",
    "ref": {
      "$link": "bafkreiba3uxw57un5654yj4rl7xyptuimpylzfvpkw6nf4mjx3anaiww6m"
    },
    "mimeType": "image/jpeg",
    "size": 281714
  },
  "path": "/2026/04/silicon-photonics-semiconductor-testing.html",
  "publishedAt": "2026-04-13T13:12:00.000Z",
  "site": "https://www.technetbooks.com",
  "title": "Silicon Photonics Semiconductor Testing Obstacles and Insertion 2 Challenges for AI Infrastructure",
  "updatedAt": "2026-04-13T13:12:38.026Z"
}