{
  "$type": "site.standard.document",
  "description": "Provided is a semiconductor device including: a semiconductor element including a first electrode, a second electrode, and a gate electrode; a surge voltage measuring unit electrically connected to the first electrode or the second electrode and configured to measure a surge voltage; a variable…",
  "path": "/patents/1244639",
  "publishedAt": "2019-09-26T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "H02M1/32",
    "Kabushiki Kaisha Toshiba"
  ],
  "textContent": "Provided is a semiconductor device including: a semiconductor element including a first electrode, a second electrode, and a gate electrode; a surge voltage measuring unit electrically connected to the first electrode or the second electrode and configured to measure a surge voltage; a variable resistor electrically connected to the gate electrode; a comparator configured to compare a surge voltage measurement value, which is acquired by measuring the surge voltage generated by a first pulse applied to the gate electrode by the surge voltage measuring unit, with a surge voltage target value; a determination unit configured to determine a setting value of a resistance value of the variable resistor based on the comparison result by the comparator; and an instruction unit configured to instruct the setting value to the variable resistor.",
  "title": "SEMICONDUCTOR DEVICE, POWER CONVERSION DEVICE, DRIVING DEVICE, VEHICLE, ELEVATOR, AND METHOD FOR CONTROLLING SEMICONDUCTOR DEVICE"
}