APPARATUS AND METHOD FOR INSPECTING DEFECT OF SECONDARY BATTERY

An apparatus for inspecting defects of a secondary battery having a pair of pressing jigs which press an outer surface of an electrode or a pouch accommodating the electrode assembly in directions corresponding to each other and on which a plurality of protrusions protrude from pressing surfaces and a measurement unit measuring one or more of current, a voltage, and resistance of the electrode assembly when the electrode assembly is pressed by the plurality of protrusions of the pair of pressing jigs is provided.