{
  "$type": "site.standard.document",
  "description": "A measuring device for measuring an object. The measuring device includes a distance measuring unit having a beam emission unit generating a measurement radiation having a defined wavelength spectrum and a detector detecting the measurement radiation reflected on the object surface, the detector…",
  "path": "/patents/1250505",
  "publishedAt": "2019-12-19T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01C3/08",
    "HEXAGON TECHNOLOGY CENTER GMBH"
  ],
  "textContent": "A measuring device for measuring an object. The measuring device includes a distance measuring unit having a beam emission unit generating a measurement radiation having a defined wavelength spectrum and a detector detecting the measurement radiation reflected on the object surface, the detector having at least one first sensor. The distance measuring unit generates distance measured data and reflection measured data as first distance measured data by emitting the measurement radiation and detecting the reflected measurement radiation according to the principle of triangulation. The measurement radiation is generated using a wavelength spectrum such that a fluorescence is excitable by an interaction of the measurement radiation with the object material to emit fluorescent light, wherein a spectrum of the fluorescent light and the wavelength spectrum of the measurement radiation are different.",
  "title": "SURFACE MEASUREMENT BY MEANS OF EXCITED FLUORESCENCE"
}