{
  "$type": "site.standard.document",
  "coverImage": {
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  "description": "A facility inspection system prevents a normal part from being detected as an abnormal part caused by a deviation in an alignment due to a presence/absence of a moving object in detecting the abnormal part in a surrounding environment of a vehicle moving on a track. The system includes a…",
  "path": "/patents/1251101",
  "publishedAt": "2019-12-26T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G06K9/00791",
    "HITACHI HIGH-TECH FINE SYSTEMS CORPORATION"
  ],
  "textContent": "A facility inspection system prevents a normal part from being detected as an abnormal part caused by a deviation in an alignment due to a presence/absence of a moving object in detecting the abnormal part in a surrounding environment of a vehicle moving on a track. The system includes a photographing device, storage device, separation unit, an alignment unit, and a extraction unit. The photographing device photographs the surrounding environment of the moving vehicle. The storage device stores a reference alignment point cloud and a reference difference-extraction point cloud for each position on the track. The separation unit separates the alignment point cloud from a three-dimensional point cloud. The alignment unit aligns the reference alignment point cloud and the alignment point cloud and outputs alignment information. The extraction unit extracts a difference between the three-dimensional point cloud deformed based on the alignment information and the reference difference-extraction point cloud.",
  "title": "FACILITY INSPECTION SYSTEM AND FACILITY INSPECTION METHOD"
}