{
  "$type": "site.standard.document",
  "description": "There is provided a measurement device including a data acquisition unit that acquires pieces of first to third data output from first to third sensors provided on a structure, an abnormality determination unit that determines whether or not each of the sensors is abnormal, a moving object…",
  "path": "/patents/1268932",
  "publishedAt": "2020-08-06T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "B60W20/50",
    "SEIKO EPSON CORPORATION"
  ],
  "textContent": "There is provided a measurement device including a data acquisition unit that acquires pieces of first to third data output from first to third sensors provided on a structure, an abnormality determination unit that determines whether or not each of the sensors is abnormal, a moving object detection unit that detects a moving object based on at least one of the first data and the second data, and a displacement amount calculation unit that calculates a displacement amount of the structure based on the third data, in which, when the first sensor provided on a main girder closest to an i-th lane of the structure or a main girder second closest to the i-th lane is not abnormal, the moving object detection unit detects the moving object moving on the i-th lane based on the first data output from the first sensor.",
  "title": "MEASUREMENT DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD"
}