{
  "$type": "site.standard.document",
  "description": "In order to provide an image processing system and method capable of achieving high-speed processing while enhancing measuring resolution, an image processing system is provided with an image capturing unit which includes a first image capturing unit and a second image capturing unit disposed…",
  "path": "/patents/1434298",
  "publishedAt": "2023-07-19T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01B11/245",
    "OMRON TATEISI ELECTRONICS CO [JP]"
  ],
  "textContent": "In order to provide an image processing system and method capable of achieving high-speed processing while enhancing measuring resolution, an image processing system is provided with an image capturing unit which includes a first image capturing unit and a second image capturing unit disposed spaced apart, and which captures mutually different images of a target object, a first calculating unit which uses at least either one of the first image capturing unit and the second image capturing unit to calculate the parallax of a first feature point using distance information, or information for calculating a distance, of a three-dimensional measuring method different from a stereo camera method, and a second calculating unit which, on the basis of the result of a search for a corresponding point to a second feature point, uses a stereo camera method employing the first image capturing unit and the second image capturing unit to calculate the parallax of the second feature point, and which identifies the three-dimensional shape of the target object from the parallax of the first feature point and the parallax of the second feature point, wherein the second calculating unit sets a search range on the basis of the parallax of the first feature point.",
  "title": "THREE-DIMENSIONAL MEASURING SYSTEM AND THREE-DIMENSIONAL MEASURING METHOD"
}