{
  "$type": "site.standard.document",
  "description": "A voltage measurement device (100) includes: a plurality of voltage detection circuits (1) which measure cell voltages of a plurality of cells connected in series. Each of the plurality of voltage detection circuits (1) includes: a device address generating circuit (271, 281) which generates a…",
  "path": "/patents/1434047",
  "publishedAt": "2023-12-20T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01R19/0084",
    "NUVOTON TECHNOLOGY CORP JAPAN [JP]"
  ],
  "textContent": "A voltage measurement device (100) includes: a plurality of voltage detection circuits (1) which measure cell voltages of a plurality of cells connected in series. Each of the plurality of voltage detection circuits (1) includes: a device address generating circuit (271, 281) which generates a device address according to a first address assignment command received from a preceding voltage detection circuit located at a preceding stage; and an address assignment command generating circuit (273, 283) which generates a second address assignment command according to the first address assignment command, and sends the second address assignment command to a next voltage detection circuit located at a next stage.",
  "title": "VOLTAGE MEASUREMENT DEVICE, VOLTAGE DETECTION CIRCUIT, AND DEVICE ADDRESS GENERATION METHOD"
}