{
  "$type": "site.standard.document",
  "description": "An approach is provided for predicting a pose error for a sensor system based on a trained machine learning model. The approach, for example, involves receiving images depicting a survey point with a known physical location. The approach also involves determining meta-data associated with the…",
  "path": "/patents/1424010",
  "publishedAt": "2025-05-21T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01C11/04",
    "HERE GLOBAL BV [NL]"
  ],
  "textContent": "An approach is provided for predicting a pose error for a sensor system based on a trained machine learning model. The approach, for example, involves receiving images depicting a survey point with a known physical location. The approach also involves determining meta-data associated with the sensor system used to capture the images. The approach further involves generating a ray from the capture location through a pixel location of the survey point on an image plane of each image. The approach further involves calculating an error between the ray generated for the image and the known physical location. The approach further involves training a machine learning model to predict a pose error from image data captured using the sensor system based on the error in combination with features extracted from the image and the meta-data for the image. The approach further involves providing the trained machined learning as an output.",
  "title": "METHOD, APPARATUS, AND SYSTEM FOR PREDICTING A POSE ERROR FOR A SENSOR SYSTEM"
}