{
  "$type": "site.standard.document",
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  "description": "Disclosed herein are a method and system for detecting inter-cell short circuits in secondary batteries. The system includes a voltage measurement unit including a probe that comes into contact with a cell of a secondary battery to measure an inter-cell voltage, a short-circuit control unit…",
  "path": "/patents/1423335",
  "publishedAt": "2026-06-18T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01R31/52",
    "Samsung SDI Co., Ltd."
  ],
  "textContent": "Disclosed herein are a method and system for detecting inter-cell short circuits in secondary batteries. The system includes a voltage measurement unit including a probe that comes into contact with a cell of a secondary battery to measure an inter-cell voltage, a short-circuit control unit configured to control an inter-cell short circuit, and an inter-cell short-circuit detection unit configured to measure a first voltage between a first cell and a second cell in the secondary battery, to create a short circuit between the first and second cells, to measure a second voltage between the first and second cells, to eliminate the short circuit between the first and second cells, to measure a third voltage between the first and second cells, and to determine whether a short circuit occurs between the first and second cells by using at least one of the first to third voltages.",
  "title": "METHOD AND SYSTEM FOR DETECTING INTER-CELL SHORT CIRCUITS IN SECONDARY BATTERIES"
}