{
  "$type": "site.standard.document",
  "coverImage": {
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  "description": "Provided is a three-dimensional measurement device, including an illumination system (I) and an imaging system (II). The illumination system includes, along an illumination light path, a light source (8), a light beam shaping apparatus (8), a pattern modulation apparatus (6), and a projection lens…",
  "path": "/patents/1418274",
  "publishedAt": "2023-01-04T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01B11/22",
    "CHENGDU PIN TAI DING FENG BUSINESS ADMINISTRATION [CN]"
  ],
  "textContent": "Provided is a three-dimensional measurement device, including an illumination system (I) and an imaging system (II). The illumination system includes, along an illumination light path, a light source (8), a light beam shaping apparatus (8), a pattern modulation apparatus (6), and a projection lens (2). The pattern modulation apparatus is configured to form a coded pattern. The light beam shaping apparatus is configured to shape light emitted by the light source into near-parallel light. The projection lens is configured to project the coded pattern onto a target object. The imaging system includes, along an imaging optical path, an imaging lens (3), a first beam-splitting system (12, 13), and an image sensor group including N image sensors (9, 10, 11). The first beam-splitting system is configured to transmit the coded pattern received by the imaging lens and projected onto the target object to the N image sensors of the image sensor group. Consequently, a compact three-dimensional measurement device capable of performing single-frame multispectral measurement is acquired.",
  "title": "THREE-DIMENSIONAL MEASUREMENT DEVICE"
}