{
  "$type": "site.standard.document",
  "description": "Measuring circuits including switched capacitors, and related systems, methods, and devices are disclosed. A measurement circuit includes a flying capacitor, a grounded capacitor, a first switch, a second switch, a third switch, and a fourth switch. The first switch is configured to selectively…",
  "path": "/patents/1297447",
  "publishedAt": "2021-08-12T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01R31/3835",
    "Microchip Technology Incorporated"
  ],
  "textContent": "Measuring circuits including switched capacitors, and related systems, methods, and devices are disclosed. A measurement circuit includes a flying capacitor, a grounded capacitor, a first switch, a second switch, a third switch, and a fourth switch. The first switch is configured to selectively electrically connect an electrochemical cell cathode node to a first terminal of the flying capacitor. The second switch is configured to selectively electrically connect an electrochemical cell anode node to a second terminal of the flying capacitor. The third switch is configured to selectively electrically connect the first terminal of the flying capacitor to a third terminal of the grounded capacitor. The fourth switch is configured to electrically connect the second terminal of the flying capacitor to a fourth terminal of the grounded capacitor. The fourth terminal is electrically connected to the reference voltage potential node.",
  "title": "MEASURING CIRCUIT USING SWITCHED CAPACITORS FOR MEASURING VOLTAGE AND RELATED SYSTEMS, METHODS, AND DEVICES"
}