{
  "$type": "site.standard.document",
  "description": "Automated methods and systems are disclosed, including a method comprising: obtaining a first three-dimensional-data point cloud of a horizontal surface of an object of interest, the first three-dimensional-data point cloud having a first resolution and having a three-dimensional location…",
  "path": "/patents/1298494",
  "publishedAt": "2021-08-26T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01S17/89",
    "Pictometry International Corp."
  ],
  "textContent": "Automated methods and systems are disclosed, including a method comprising: obtaining a first three-dimensional-data point cloud of a horizontal surface of an object of interest, the first three-dimensional-data point cloud having a first resolution and having a three-dimensional location associated with each point in the first three-dimensional-data point cloud; capturing one or more aerial image, at one or more oblique angle, depicting at least a vertical surface of the object of interest; analyzing the one or more aerial image with a computer system to determine three-dimensional locations of additional points on the object of interest; and updating the first three-dimensional-data point cloud with the three-dimensional locations of the additional points on the object of interest to create a second three-dimensional-data point cloud having a second resolution greater than the first resolution of the first three-dimensional-data point cloud.",
  "title": "Augmented Three Dimensional Point Collection of Vertical Structures"
}