SECONDARY CELL INSPECTION METHOD AND SECONDARY CELL INSPECTION DEVICE

Provided is a secondary battery inspection device capable of improving inspection accuracy while simplifying the inspection of a secondary battery. Value of a model parameter of a secondary battery model is identified based on a sampling period T. In the secondary battery model, impedance of internal resistance of a secondary battery 200 is expressed by an IIR transfer function and an FIR transfer function. When impulse current I(t) is input to a specified model as the secondary battery model the value of the model parameter of which is identified, a model output voltage as a voltage change form output from the specified model is estimated. The performance of the secondary battery 200 according to the sampling period T is evaluated based on the measurement result of the voltage of the secondary battery 200 when the impulse current I(t) flows into the secondary battery 200, and the specified model output voltage.