{
  "$type": "site.standard.document",
  "description": "A structure for pressurization analysis includes a sample accommodating unit (10) for accommodating an all-solid-state battery (S) therein, and a pressurizing unit (30) having a pressurizing mechanism for causing pressure to act on the all-solid-state battery (S). The all-solid-state battery (S) is…",
  "path": "/patents/1411714",
  "publishedAt": "2025-02-26T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01N23/20033",
    "RIGAKU DENKI CO LTD [JP]"
  ],
  "textContent": "A structure for pressurization analysis includes a sample accommodating unit (10) for accommodating an all-solid-state battery (S) therein, and a pressurizing unit (30) having a pressurizing mechanism for causing pressure to act on the all-solid-state battery (S). The all-solid-state battery (S) is pressurized inside the sample accommodating unit (10) while being sandwiched between a pressure receiving member (21) and a pressing member (22). Further, an X-ray window (14) is provided in an outer radial direction orthogonal to an acting direction of the pressure from the pressurizing unit (30), and reflection type X-ray diffraction measurement can be performed through the X-ray window (14). The structure includes as well electrode terminals (26, 48) for connecting to current collector layers of the all-solid-state battery (S) in order to perform electrochemical cycling measurements.",
  "title": "STRUCTURE FOR PRESSURIZATION ANALYSIS, X-RAY DIFFRACTION APPARATUS AND PRESSURIZATION ANALYSIS SYSTEM"
}