APPARATUS AND METHOD FOR MEASURING THICKNESS OF UNIT CELL

An apparatus for measuring a thickness of a unit cell according to the present invention comprises: a plurality of transfer rollers configured to sequentially transfer unit cells and disposed to be spaced a predetermined distance from each other; and a thickness sensor disposed at a fixed position to irradiate light to a moving path of the unit cells and calculate a time when receiving the reflected light, thereby measuring a thickness of each of the unit cells.A method for measuring a thickness of a unit cell according to the present invention comprises: a unit cell transferring step (S1) of transferring unit cells through a plurality of transfer rollers which are spaced a predetermined distance from each other; a distance measuring step (S2) of irradiating light to a top surface of the unit cell through an upper thickness sensor and irradiating light to a bottom surface of the unit cell through a lower thickness sensor to calculate a time when receiving the reflected light, thereby measuring a distance between the upper thickness sensor and the top surface of the unit cell and a distance between the lower thickness sensor and the bottom surface of the unit cell; and a thickness calculating step (S3) of subtracting a measured value of the distance between the upper thickness sensor and the top surface of the unit cell and a measured value of the distance between the lower thickness sensor and the bottom surface of the unit cell from a distance between the upper thickness sensor and the lower thickness sensor to calculate the thickness of the unit cell.