Unevenness level inspecting device, unevenness level inspectiing system, and unevenness level inspecting method

An unevenness level inspecting device includes a target T at a known distance from a to-be-inspected surface, a traveling unit for traveling on the to-be-inspected surface, a first marker for marking information on the to-be-inspected surface, and a control unit configured to control the first marker, and the control unit calculates a height of the to-be-inspected surface at a measurement position of the target T based on three-dimensional position coordinates of the target input each time the unevenness level inspecting device travels a predetermined distance, and controls the first marker so as to mark unevenness level information indicating a difference between the height of the to-be-inspected surface and a reference height on a corresponding position on the to-be-inspected surface, and the unevenness level information is marked in a color that differs depending on a magnitude of the difference between the height of the to-be-inspected surface and the reference height.