{
  "$type": "site.standard.document",
  "description": "Devices, systems, and methods are provided for enhanced sensor cleaning validation. A device may determine a baseline performance measurement associated with a clean performance baseline of a sensor. The device may actuate a cleaning mechanism to remove at least a portion of an obstruction…",
  "path": "/patents/1310478",
  "publishedAt": "2022-02-10T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "B60W50/0205",
    "Argo AI, LLC"
  ],
  "textContent": "Devices, systems, and methods are provided for enhanced sensor cleaning validation. A device may determine a baseline performance measurement associated with a clean performance baseline of a sensor. The device may actuate a cleaning mechanism to remove at least a portion of an obstruction deposited on the sensor. The device may determine a first post-clean performance measurement associated with the sensor. The device may determine a degradation measurement between the baseline performance measurement and the first post-clean performance measurement, wherein the degradation measurement indicates an effectiveness of the cleaning mechanism.",
  "title": "ENHANCED SENSOR CLEANING VALIDATION"
}