{
  "$type": "site.standard.document",
  "description": "An anode material includes a silicon composite substrate. In the X-ray diffraction pattern of the anode material, the highest intensity at 2θ within the range of 28.0° to 29.0° is I, and the highest intensity at 2θ within the range of 20.5° to 21.5° is I, wherein 0",
  "path": "/patents/1311104",
  "publishedAt": "2022-02-17T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "H01M4/483",
    "Ningde Amperex Technology Limited"
  ],
  "textContent": "An anode material includes a silicon composite substrate. In the X-ray diffraction pattern of the anode material, the highest intensity at 2θ within the range of 28.0° to 29.0° is I, and the highest intensity at 2θ within the range of 20.5° to 21.5° is I, wherein 0",
  "title": "ANODE MATERIAL, ELECTROCHEMICAL DEVICE AND ELECTRONIC DEVICE COMPRISING THE SAME"
}