INSPECTION METHOD AND MANUFACTURING METHOD FOR STRUCTURE AND INSPECTION APPARATUS AND MANUFACTURING APPARATUS FOR STRUCTURE

It is possible to detect, with high accuracy, whether a structure is a good product or a defective product. This inspection apparatus for a structure comprises: X-ray emitting means () for emitting X-rays through two or more paths; one or more X-ray detection means () for detecting the X-rays passing through the a structure (); a multiple position distance measurement means () for measuring the distance from the X-ray emitting means to the structure at a plurality of positions; and an image processing means (). The image processing means includes: a defective candidate detection means for detecting a defective candidate in two or more images acquired by the X-ray detection means; a height measurement means; an image calculation means for logically multiplying an image, on which height position information obtained by the height measurement means is recorded, by a defective candidate image obtained by the defective candidate detection means; an inspection range setting means for setting an inspection range from the distance and the thickness of the structure; and a defect determination means for determining that there is a defect when the inspection range includes the defective candidate.