{
  "$type": "site.standard.document",
  "description": "To efficiently and accurately detect coordinates positions of a measurement object formed in a linear shape regardless of a distance from a measurement light emitting unit. The provided survey system includes: a distance measuring unit; a deflecting unit for deflecting a direction of measurement…",
  "path": "/patents/1313738",
  "publishedAt": "2022-03-24T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01C15/002",
    "Topcon Corporation"
  ],
  "textContent": "To efficiently and accurately detect coordinates positions of a measurement object formed in a linear shape regardless of a distance from a measurement light emitting unit. The provided survey system includes: a distance measuring unit; a deflecting unit for deflecting a direction of measurement light with respect to a reference optical axis and for scanning with the measurement light with respect to a prescribed center in a circumferential direction; and a calculation control unit which controls the distance measuring unit and the deflecting unit, wherein the calculation control unit detects coordinates of intersection points of a measurement object formed in a linear shape and a scan trajectory of the measurement light, and controls a deflection operation of the deflecting unit so that intervals of the intersection points adjacent to each other are constant intervals on the measurement object.",
  "title": "MEASUREMENT DEVICE AND METHOD FOR CONTROLLING MEASUREMENT DEVICE"
}