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  "description": "A structure for pressurization analysis includes a sample accommodating unit () for accommodating an all-solid-state battery (S) therein, and a pressurizing unit () having a pressurizing mechanism for causing pressure to act on the all-solid-state battery (S). The all-solid-state battery (S) is…",
  "path": "/patents/1314323",
  "publishedAt": "2022-03-31T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01N23/20041",
    "RIGAKU CORPORATION"
  ],
  "textContent": "A structure for pressurization analysis includes a sample accommodating unit () for accommodating an all-solid-state battery (S) therein, and a pressurizing unit () having a pressurizing mechanism for causing pressure to act on the all-solid-state battery (S). The all-solid-state battery (S) is pressurized inside the sample accommodating unit () while being sandwiched between a pressure receiving member () and a pressing member (). Further, an X-ray window () is provided in an outer radial direction orthogonal to an acting direction of the pressure from the pressurizing unit (), and reflection type X-ray diffraction measurement can be performed through the X-ray window ().",
  "title": "STRUCTURE FOR PRESSURIZATION ANALYSIS, X-RAY DIFFRACTION APPARATUS AND PRESSURIZATION ANALYSIS SYSTEM"
}