{
"$type": "site.standard.document",
"coverImage": {
"$type": "blob",
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"description": "The present invention relates to a method and an apparatus for detecting a failure of a sensor device during operation of the sensor device. A test signal is generated in a first frequency band that is above a signal frequency band of the sensor device and fed into a sensor element of the sensor…",
"path": "/patents/1404412",
"publishedAt": "2025-12-03T00:00:00.000Z",
"site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
"tags": [
"B81B7/008",
"MURATA MANUFACTURING CO [JP]"
],
"textContent": "The present invention relates to a method and an apparatus for detecting a failure of a sensor device during operation of the sensor device. A test signal is generated in a first frequency band that is above a signal frequency band of the sensor device and fed into a sensor element of the sensor device. A set of samples is obtained, and a magnitude value is derived from said at least two consecutive samples at the first frequency band. The magnitude value is compared to a magnitude threshold value that defines a minimum for the magnitude value and if the magnitude value is below the magnitude threshold value, it is determined that an error has occurred in the sensor device.",
"title": "SAFETY MECHANISM FOR SENSORS"
}