{
  "$type": "site.standard.document",
  "description": "Method and system for utilizing sequential input inertial sensor data to calculate recursive features for training a machine learning algorithm or for classifying the data as a known class. The recursive feature values of a current data sample are calculating based on comparisons between the…",
  "path": "/patents/1403295",
  "publishedAt": "2025-10-15T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01C19/5712",
    "ST MICROELECTRONICS SRL [IT]"
  ],
  "textContent": "Method and system for utilizing sequential input inertial sensor data to calculate recursive features for training a machine learning algorithm or for classifying the data as a known class. The recursive feature values of a current data sample are calculating based on comparisons between the current data sample value and previous recursive feature values. The recursive features include a recursive maximum, recursive minimum, recursive peak to peak, recursive average, recursive root mean square, and recursive variance.",
  "title": "METHOD AND SYSTEM FOR EXTRACTING FEATURES FOR USE IN EMBEDDED ARTIFICIAL INTELLIGENCE MECHANISMS"
}