{
  "$type": "site.standard.document",
  "description": "A transistor diagnostic circuit includes a protection transistor output terminal, a fault terminal, and circuitry coupled to the protection transistor output terminal and the fault terminal. The protection transistor output terminal is adapted to be coupled to a current terminal of a protection…",
  "path": "/patents/1317128",
  "publishedAt": "2022-05-05T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "H03K17/0822",
    "Texas Instruments Incorporated"
  ],
  "textContent": "A transistor diagnostic circuit includes a protection transistor output terminal, a fault terminal, and circuitry coupled to the protection transistor output terminal and the fault terminal. The protection transistor output terminal is adapted to be coupled to a current terminal of a protection transistor. The transistor diagnostic circuit is configured to, at start-up, load the protection transistor output terminal to test the protection transistor, and to generate a fault signal at the fault terminal responsive to a voltage on the protection transistor output terminal exceeding a threshold.",
  "title": "TRANSISTOR DIAGNOSTIC CIRCUIT"
}