{
  "$type": "site.standard.document",
  "description": "A system and method is provided for measuring a voltage drop at a node (V). In embodiments, a circuit includes an analog-to-digital converter (402), a current sink (406), and a controller. The input of the analog-to-digital converter (402) and the input of the current sink (406) is coupled to the…",
  "path": "/patents/1402083",
  "publishedAt": "2024-07-24T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "B60R21/0173",
    "ST MICROELECTRONICS SRL [IT]"
  ],
  "textContent": "A system and method is provided for measuring a voltage drop at a node (V). In embodiments, a circuit includes an analog-to-digital converter (402), a current sink (406), and a controller. The input of the analog-to-digital converter (402) and the input of the current sink (406) is coupled to the node (V) to be measured. A set point for the current sink (406) is determined. The output of the analog-to-digital converter (402) during the voltage drop is sampled. And a relative voltage drop value is computed by subtracting the sampled output of the analog-to-digital converter (402) during the voltage drop from a sampled output of the analog-to-digital converter (402) during a steady-state condition. The current sink (406) operating at the set point during the steady-state condition and during the voltage drop.",
  "title": "MEASURING A CHANGE IN VOLTAGE"
}