{
  "$type": "site.standard.document",
  "description": "A system and method for measuring a capacitance value of a capacitor (102) are provided. In embodiments, a resistor (112) is coupled to a terminal of the capacitor (102). A difference in voltage at the terminal between a first time and a second time during a discharge routine of the capacitor (102)…",
  "path": "/patents/1402067",
  "publishedAt": "2024-07-10T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01R27/2605",
    "ST MICROELECTRONICS SRL [IT]"
  ],
  "textContent": "A system and method for measuring a capacitance value of a capacitor (102) are provided. In embodiments, a resistor (112) is coupled to a terminal of the capacitor (102). A difference in voltage at the terminal between a first time and a second time during a discharge routine of the capacitor (102) is measured. The discharge routine includes sinking a current through a discharge circuit (108, 110) coupled to the resistor (112) from first to second. Integration of a difference in voltage at terminals of the resistor (112) during the discharge routine between the first and second times is also measured. The capacitance value is computed based on the measured difference in voltage, the measured integration, and the resistance value of the resistor (112). The health of the capacitor (102) is determined based on a difference between the computed capacitance value and a threshold value.",
  "title": "CAPACITOR MEASUREMENT"
}