{
  "$type": "site.standard.document",
  "coverImage": {
    "$type": "blob",
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  "description": "Provided is a technology to enable printing of unevenness level information on a to-be-inspected surface in an intuitively and visually recognizable manner. An unevenness level inspecting device 1 includes a target T at a known distance from a to-be-inspected surface, a traveling unit 21 for…",
  "path": "/patents/1400986",
  "publishedAt": "2024-07-17T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "B25H7/04",
    "TOPCON CORP [JP]"
  ],
  "textContent": "Provided is a technology to enable printing of unevenness level information on a to-be-inspected surface in an intuitively and visually recognizable manner. An unevenness level inspecting device 1 includes a target T at a known distance from a to-be-inspected surface, a traveling unit 21 for traveling on the to-be-inspected surface, a first marker 23 for marking information on the to-be-inspected surface, and a control unit 10 configured to control the first marker 23, and the control unit 10 calculates a height of the to-be-inspected surface at a measurement position of the target T based on three-dimensional position coordinates of the target T input each time the unevenness level inspecting device 1 travels a predetermined distance, and controls the first marker 23 so as to mark unevenness level information indicating a difference between the height of the to-be-inspected surface and a reference height on a corresponding position on the to-be-inspected surface, and the unevenness level information is marked in a color that differs depending on a magnitude of the difference between the height of the to-be-inspected surface and the reference height.",
  "title": "UNEVENNESS LEVEL INSPECTING DEVICE, UNEVENNESS LEVEL INSPECTING SYSTEM, AND UNEVENNESS LEVEL INSPECTING METHOD"
}