{
  "$type": "site.standard.document",
  "description": "A system and method is provided for measuring a voltage drop at a node. In embodiments, a circuit includes an analog-to-digital converter, a current sink, and a controller. The input of the analog-to-digital converter and the input of the current sink is coupled to the node to be measured. A set…",
  "path": "/patents/1338092",
  "publishedAt": "2023-02-23T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G01R19/10",
    "STMicroelectronics S.r.l."
  ],
  "textContent": "A system and method is provided for measuring a voltage drop at a node. In embodiments, a circuit includes an analog-to-digital converter, a current sink, and a controller. The input of the analog-to-digital converter and the input of the current sink is coupled to the node to be measured. A set point for the current sink is determined. The output of the analog-to-digital converter during the voltage drop is sampled. And a relative voltage drop value is computed by subtracting the sampled output of the analog-to-digital converter during the voltage drop from a sampled output of the analog-to-digital converter during a steady-state condition. The current sink operating at the set point during the steady-state condition and during the voltage drop.",
  "title": "MEASURING A CHANGE IN VOLTAGE"
}