MONITORING AN IDEAL DIODE

A method for monitoring an ideal diode comprises controlling a source-gate voltage of a MOSFET of the ideal diode such that the ideal diode can be changed between an off and an on state with a first target value for a source-drain voltage. To detect error states, the source-drain voltage and the source-gate voltage are measured. A check is carried out to determine whether the source-drain voltage reaches the first target value within predefined error limits in the on state. A test mode is carried out, in which a second target value which smaller than the first target value is set for the source-drain voltage. A check is carried out to determine whether the source-gate voltage reaches an upper threshold value when the test mode is being carried out. An error signal is output when the first target value and/or the upper threshold value is/are not reached.