METHOD FOR MANUFACTURING SPECIMEN FOR ADHESION TEST OF ELECTRODE ACTIVE MATERIAL LAYER

The present invention provides a device used for fabricating a specimen for testing the adhesive force between an electrode active material layer and a current collector, which comprises a lower guide panel having a guide groove on its upper surface wherein the guide groove guides and accommodates a fixing substrate to which the electrode active material layer is adhered, and an upper guide panel having a guide hole for guiding the adhesion position of the electrode active material layer to the fixing substrate accommodated in the guide groove, wherein the upper guide panel is provided with a coupling means for the upper portion of the lower guide panel, and a method for fabricating the specimen using the same.