{
  "$type": "site.standard.document",
  "description": "A method of handling one or more errors in a microgrid includes measuring an attribute of a device within the microgrid for a measurement cycle and comparing the measured attribute of the device with a predetermined threshold attribute value. The presence of an error associated with the device is…",
  "path": "/patents/964964",
  "publishedAt": "2026-05-26T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "H02J3/001",
    "ABB Schweiz AG"
  ],
  "textContent": "A method of handling one or more errors in a microgrid includes measuring an attribute of a device within the microgrid for a measurement cycle and comparing the measured attribute of the device with a predetermined threshold attribute value. The presence of an error associated with the device is detected based on the comparison of the measured attribute with the predetermined threshold attribute value. An error signal is created that includes a numerical sequence having at least three digits, the numerical sequence identifying the measured attribute and the device within the microgrid.",
  "title": "Microgrid error handling framework and method"
}