{
  "$type": "site.standard.document",
  "description": "A calibration scale includes a scale body and at least two calibration pattern subsets arranged on the scale body along a first direction. The at least two calibration pattern subsets include a plurality of first calibration blocks arranged at spacings along the first direction and staggered along…",
  "path": "/patents/1359699",
  "publishedAt": "2024-02-22T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "G06T7/85",
    "CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED"
  ],
  "textContent": "A calibration scale includes a scale body and at least two calibration pattern subsets arranged on the scale body along a first direction. The at least two calibration pattern subsets include a plurality of first calibration blocks arranged at spacings along the first direction and staggered along a second direction. Projections of the plurality of first calibration blocks in each calibration pattern subset along the first direction have a first overlapping area. Projections of at least two first overlapping areas along the first direction have a second overlapping area.",
  "title": "CALIBRATION SCALE, CALIBRATION METHOD AND APPARATUS, AND DETECTION METHOD AND APPARATUS"
}