{
  "$type": "site.standard.document",
  "description": "This invention provide a testing device and method for a quantum battery by a semiconductor probe, whereby the electrical characteristics of the charging layer can be evaluated during the quantum battery manufacturing process. The testing device equipped with a semiconductor probe(50) constituted…",
  "path": "/patents/970737",
  "publishedAt": "2014-09-03T00:00:00.000Z",
  "site": "at://did:plc:oql6ds5vnff4ugar6rruliwd/site.standard.publication/3mn3ohu7oxx5w",
  "tags": [
    "B82Y10/00",
    "NIHON MICRONICS KK [JP]"
  ],
  "textContent": "This invention provide a testing device and method for a quantum battery by a semiconductor probe, whereby the electrical characteristics of the charging layer can be evaluated during the quantum battery manufacturing process. The testing device equipped with a semiconductor probe(50) constituted by a conductive electrode(54) and a metal oxide semiconductor layer(56) comprising a metal oxide semiconductor which are laminated on a support (52), a source voltage(62) for applying voltage across an electrode(54) equipped to the semiconductor probe(50) and a basic electrode(14) laminated on a secondary battery charging layer (18), and an ammeter (64) for measuring the current flowing between the electrode(54) equipped on the semiconductor probe (50) and the basic electrode (14) of the secondary battery on which charging layer(18) is laminated, and measures the current-voltage characteristics of the charging layer(18).",
  "title": "DEVICE AND METHOD FOR TESTING OF QUANTUM CELL BY SEMICONDUCTOR PROBE"
}